Author Details

Syafaah, Lailis, Universitas Muhammadiyah Malang, Indonesia

  • No 3 (2017) - Sentra Articles
    IDDQ TESTING FOR DETECTING RESISTIVE OPEN DEFECTS IN HCMOS LOGIC ICS
    Abstract  PDF
  • No 2 (2016) - Sentra Articles
    SISTEM PENDUKUNG KEPUTUSAN UNTUK KLASIFIKASI KOMPLIKASI DIABETES MELLITUS TIPE 2 BERDASARKAN PERKENI
    Abstract
  • No 2 (2016) - Sentra Articles
    OPEN DEFECT DETECTIONS OF CMOS ICS BY USING IDDQ TESTING
    Abstract