OPEN DEFECT DETECTIONS OF CMOS ICS BY USING IDDQ TESTING

Widianto Widianto, Lailis Syafaah, Nurhadi Nurhadi

Abstract


An IDDQ testing is proposed to detect an open defect at an input gate in a CMOS IC. The testing is based on measuring aquiescent supply current IDDQ on the IC. When the open defect occurs at the input gate, the large IDDQ will flow to the ICregardless test input vectors which generate to it. On the other hand, in the defect-free IC, the large IDDQ does not flow to theIC. The testing is implemented in the CMOS IC designed by a Spice net list library of NXP Co. Ltd and is examined using aSpice simulation. Simulation results show that the open defect can be detected by the IDDQ testing.

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DOI: https://doi.org/10.22219/sentra.v0i2.1867

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Universitas Muhammadiyah Malang Kampus III

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